Aurora Solar Technologies Launches Bifacial Solar Cell Optimization System “Decima Gemini”

Aurora‘s Bifacial Solar Cell Optimization System, Decima Gemini can accurately measure the bifacial cell’s back-surface field without interference from wafer resistivity variations – a crucial need for this type of application.

Aurora Solar Technologies Inc. has announced the launch of an enhanced version of its Decima inline measurement system “Decima Gemini” for quality control of bifacial solar cells during production.

Bifacial solar cells have an open and active backside which enables collection of reflected light available from the earth, rooftops, etc. generating up to 25% more energy than traditional cells. Aurora’s system, called “Decima Gemini”, consists of a specialized pair of Decima CD measurement heads. With this new system, the sheet resistance of the wafers’ back-surface field and emitter are measured accurately and simultaneously said the company in a statement. Each Decima Gemini system is managed and controlled as a unit by Aurora’s Veritas process visualization software.

This measurement capability results from Aurora’s patented Infrared Reflectometry measurement technology, which measures doped semiconductor layers without contacting the cell or the need for an electrical junction between doped layers. Because of this, the bifacial solar cell optimization system Decima can accurately measure the bifacial cell’s back-surface field without interference from wafer resistivity variations – a crucial need for this type of application. No other back-surface field measurement technique is currently available without the complicated use of monitor wafers that reduce production yield and prohibit complete monitoring of production.

The company states that Decima Gemini product is designed as a unit to fit above and below a wafer conveyor, and measures 100 percent of wafers at full production line speeds. Aurora’s Veritas process visualization software provides process engineers and operators with a simple, single point to monitor and control the critical back-surface field and emitter formation processes. Furthermore, the Decima Gemini system provides spatially-resolved measurements to allow manufacturers to observe and control intra-wafer variations.

“The Decima Gemini, which we are currently installing with an existing customer on multiple lines, is a direct response to increasing requests we have received from bifacial cell manufacturers for process monitoring and control“, said Gordon Deans, Chief Operating Officer of Aurora. “Prior to the introduction of the Decima Gemini technology, manufacturers were forced to rely on manual sampling techniques that are wasteful and inadequate for control of the more complex and sensitive bifacial cell fabrication process. With our products, manufacturers get accurate measurement of 100 percent of the wafers in production, enabling them to achieve maximum yield in their bifacial manufacturing lines.”